Semiconductor Spring Probes are used for test process in production of semiconductor devices. Most of these miniature spring loaded probes are so called double-ended probes, this because on both end are plungers with custom made tips. They are assembled in IC Test Sockets as well as into wafer probe cards.Their function is to vertically connect semiconductor with PCB. Our semicon probes represent excellent quality with low resistance.
IC Test Sockets use semicon probes, also called as pogo pins.We offer single and double ended semicon probes.
Standard Pitch
Fine Pitch
Kelvin Probes
Non-Magnetic
High Frequency
High Current – High Temperatue
Semicon Probes or PogoPins are used in Front-End and Back-End Test process. Main applications at front end test are prober interface board, spring contactor assembly and probe cards in a prober test head. At back-end after assembly they are used inside of test sockets for final test or in autohandler IC tester also inside test sockets
For more information please contact us at: info@equip-test.com
